Novel Sample Preparation Technique To Improve Spectromicroscopic Analyses of Micrometer-Sized Particles
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Novel Sample Preparation Technique To Improve Spectromicroscopic Analyses of Micrometer-Sized Particles. / Höschen, Carmen; Höschen, Till; Mueller, Carsten W.; Lugmeier, Johann; Elgeti, Stefan; Rennert, Thilo; Kögel-Knabner, Ingrid.
In: Environmental Science and Technology, Vol. 49, No. 16, 2015, p. 9874-9880.Research output: Contribution to journal › Journal article › Research › peer-review
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TY - JOUR
T1 - Novel Sample Preparation Technique To Improve Spectromicroscopic Analyses of Micrometer-Sized Particles
AU - Höschen, Carmen
AU - Höschen, Till
AU - Mueller, Carsten W.
AU - Lugmeier, Johann
AU - Elgeti, Stefan
AU - Rennert, Thilo
AU - Kögel-Knabner, Ingrid
PY - 2015
Y1 - 2015
N2 - Microscale processes occurring at biogeochemical interfaces in soils and sediments have fundamental impacts on phenomena at larger scales. To obtain the organo-mineral associations necessary for the study of biogeochemical interfaces, bulk samples are usually fractionated into microaggregates or micrometer-sized single particles. Such fine-grained mineral particles are often prepared for nanoscale secondary ion mass spectroscopy (NanoSIMS) investigations by depositing them on a carrier. This introduces topographic differences, which can strongly affect local sputtering efficiencies. Embedding in resin causes undesired C impurities. We present a novel method for preparing polished cross-sections of micrometer-sized primary soil particles that overcomes the problems of topography and C contamination. The particles are coated with a marker layer, embedded, and well-polished. The interpretation of NanoSIMS data is assisted by energy-dispersive X-ray spectroscopy on cross-sections prepared by a focused ion beam. In the cross-sections, organic assemblages on the primary soil particles become visible. This novel method significantly improves the quality of NanoSIMS measurements on grainy mineral samples, enabling better characterization of soil biogeochemical interfaces. In addition, this sample preparation technique may also improve results from other (spectro-) microscopic techniques.
AB - Microscale processes occurring at biogeochemical interfaces in soils and sediments have fundamental impacts on phenomena at larger scales. To obtain the organo-mineral associations necessary for the study of biogeochemical interfaces, bulk samples are usually fractionated into microaggregates or micrometer-sized single particles. Such fine-grained mineral particles are often prepared for nanoscale secondary ion mass spectroscopy (NanoSIMS) investigations by depositing them on a carrier. This introduces topographic differences, which can strongly affect local sputtering efficiencies. Embedding in resin causes undesired C impurities. We present a novel method for preparing polished cross-sections of micrometer-sized primary soil particles that overcomes the problems of topography and C contamination. The particles are coated with a marker layer, embedded, and well-polished. The interpretation of NanoSIMS data is assisted by energy-dispersive X-ray spectroscopy on cross-sections prepared by a focused ion beam. In the cross-sections, organic assemblages on the primary soil particles become visible. This novel method significantly improves the quality of NanoSIMS measurements on grainy mineral samples, enabling better characterization of soil biogeochemical interfaces. In addition, this sample preparation technique may also improve results from other (spectro-) microscopic techniques.
U2 - 10.1021/acs.est.5b01636
DO - 10.1021/acs.est.5b01636
M3 - Journal article
C2 - 26196852
AN - SCOPUS:84939537942
VL - 49
SP - 9874
EP - 9880
JO - Environmental Science & Technology
JF - Environmental Science & Technology
SN - 0013-936X
IS - 16
ER -
ID: 239161125