Understanding surface chemical processes in environmental contamination: New applications for AFM
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Standard
Understanding surface chemical processes in environmental contamination: New applications for AFM. / Stipp, S.L.S.; Eggleston, C.M.
I: Forces in Scanning Probe Methods. NATO Advanced Study Institute, Series E, Nr. Applied Science 286, 1995, s. 483-488.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning
Harvard
Stipp, SLS & Eggleston, CM 1995, 'Understanding surface chemical processes in environmental contamination: New applications for AFM', Forces in Scanning Probe Methods. NATO Advanced Study Institute, Series E, nr. Applied Science 286, s. 483-488.
APA
Stipp, S. L. S., & Eggleston, C. M. (1995). Understanding surface chemical processes in environmental contamination: New applications for AFM. Forces in Scanning Probe Methods. NATO Advanced Study Institute, Series E, (Applied Science 286), 483-488.
Vancouver
Stipp SLS, Eggleston CM. Understanding surface chemical processes in environmental contamination: New applications for AFM. Forces in Scanning Probe Methods. NATO Advanced Study Institute, Series E. 1995;(Applied Science 286):483-488.
Author
Bibtex
@article{f0f97f2074bf11dbbee902004c4f4f50,
title = "Understanding surface chemical processes in environmental contamination: New applications for AFM",
abstract = "Geologi",
author = "S.L.S. Stipp and C.M. Eggleston",
year = "1995",
language = "English",
pages = "483--488",
journal = "Forces in Scanning Probe Methods. NATO Advanced Study Institute, Series E",
number = "Applied Science 286",
}
RIS
TY - JOUR
T1 - Understanding surface chemical processes in environmental contamination: New applications for AFM
AU - Stipp, S.L.S.
AU - Eggleston, C.M.
PY - 1995
Y1 - 1995
N2 - Geologi
AB - Geologi
M3 - Journal article
SP - 483
EP - 488
JO - Forces in Scanning Probe Methods. NATO Advanced Study Institute, Series E
JF - Forces in Scanning Probe Methods. NATO Advanced Study Institute, Series E
IS - Applied Science 286
ER -
ID: 40201